陳苡諺
姓名 陳苡諺
職稱 助理教授
聯絡電話 05-6315480
電子郵件
專長領域 電子顯微鏡、薄膜製程、缺陷分析、透明導電薄膜

 

主要學歷：

國立台灣大學 材料科學與工程系 博士

專長與研究領域：

電子顯微鏡、薄膜製程、缺陷分析、透明導電薄膜

 

相關經歷：

力晶積成電子製造股份有限公司 結構分析部 2018/7-2024/1

台灣積體電路製造股份有限公司 化學機械研磨部 2015/8-2018/2

  1. Y. Chen, P.Y. Chen, S. L. Cheng, B.M. Huang, J.R. Yang, M. Kawasaki, and M. Shiojiri, Structure and electrical property changes of ZnO:Al films, prepared by radio frequency magnetron sputtqering, by thermal annealing, Microsc. Microanal. 21 (Suppl 3) (2015) 1797-1798.
  2. Roy, S. Maikap, G. Sreekanth, M. Dutta, D. Jana, Y.Y. Chen, and J.R. Yang, Improved resistive switching phenomena and mechanism using Cu-Al alloy in a new Cu:AlOx/TaOx/TiN structure, J. Alloy compd. 637 (2015) 517-523.
  3. Jana, S.Maikap, A. Prakash, Y.Y. Chen, H.C. Chiu, and J.R. Yang, Enhanced Resistive switch phenomena using low-positive-voltage format and self-compliance IrOx/GdOx/W cross-point memories, Nanoscale Research Letters, 9 (2014) 12-1~8.
  4. K. Chiu, C. T. Lee, D. Y. Chiang, W. H. Cho, C. N. Hsiao. Y. Y. Chen, B. M. Huang, and J. R. Yang, Conductive and transparent multilayer films for low-temperature TiO2/Ag/SiO2 electrons by E-beam evaporation with IAD, Nanoscale Research Letters, 9 (2014) 35-1~8.
  5. Y. Chen, J.R. Yang, S.L. Cheng, M. Shiojiri, Structural Investigation of ZnO:Al Films Deposited on the Si Substrates by Radio Frequency Magnetron Sputtering, Thin Solid Films 545 (2013) 183-187.
  6. Banerjee, S. Maikap, C.S. Lai, Y.Y. Chen, T.C. Tien, H.Y. Lee, W.S. Chen, F.T. Chen, M.J. Tsai, J.R. Yang, Formation Polarity Dependent Improved Resistive Switching Memory Characteristics Using Nanoscale (1.3 nm) Core-shell IrOx Nano-dots, Nanoscale Research Letters, 7 (2012) 194.
  7. L. Cheng, Y.Y. Chen, S.W. Lee, H.F. Hsu, Formation of Mg2Ni Alloy Layers and Kinetic Studies in the Binary Mg-Ni System, Thin Solid Films, 517 (2009) 4745-4748.

國外研討會

  1. Y. Chen, J.R. Yang, and M. Shiojiri: S Structural investigations of ZnO:Al films deposited by radio frequency magnetron sputtering. the 8th Asian Microscopy Conference and the 32st Microsc. Soc. Thailand Annual Conference, Nakhon Pathom, Thailand, 2015, pp. 5-6.
  2. Y. Chen, P.Y. Chen, S.L. Cheng, B.M. Huang, J.R. Yang, M. Kawasaki, and M. Shiojiri: Structural and Electrical Property Changes of ZnO:Al Film, Prepared by Radio Frequency Magnetron Sputtering, by Thermal Annealing. The 18th International Microscopy Congress 2014, Praha, Czech, 2014
  3. Y. Chen, T.Y. Wang, H.T. Chang, J.R. Yang, S.W. Lee, and M. Shiojiri: Structural Analysis of Si0.9Ge0.1/Si Epitaxial Layers by Convergent Beam Electron Diffraction. The 1st East-Asia Microscopy Conference (EAMC-1), Chong Qing, China, 2013
  4. Y. Chen and S. L. Cheng: Formation and Mg2Ni Alloy Layers and Kinetic Studies in the Binary Mg-Ni System. The 4th International Conference on Technological of Advances of Thin Films and surface coatings, Singapore, 2008

國內研討會

  1. Y. Chen, D. Jana, Y.W. Chen, S. Maikap, and J.R. Yang: Electron Beam Induced Curve TiO2 Film during the Observation of Transmission Electron Microscopy. The 3rd International Symposium on Next-Generation Electronics, Tao-Yuan, Taiwan, 2014
  2. Y. Chen, T.Y. Wang, H.T. Chang, J.R. Yang, and S.W. Lee: The Critical Thickness Measurement of Strain Relaxation of SiGe Epitaxial Layer by Convergent-beam Electron Diffraction. The 7th International Conference on Advanced Materials Processing 2012 (ICAMP 2012), Taipei, Taiwan, 2012
  3. Y. Chen, W. Banerjee, S. Maikap, and J.R. Yang: The Microstructure Investigation of HfO2 Thin Film after Post-annealing. The 12th International Conference in Asia (IUMRS-ICA 2011), Taipei, Taiwan, 2011

專利

  1. 陳苡諺, 試片製備方法及試片製備系統, 中華民國專利, 證號: I755883