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Laboratory of X-ray Diffraction
X-ray Diffraction Laboratory
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Laboratory Name :
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X-ray Diffraction Laboratory
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Supervisor :
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Tsai Ting-Kan
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Co-Supervisor :
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Fang Chao-Hsun
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Research Areas :
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X-rays were discovered in 1895 by the German physicist Wilhelm Röntgen. The discovery of X-rays has made significant contributions to the development of science, technology, industry, and medicine. This discovery and subsequent research laid the foundation for many modern technologies, especially in the field of materials science. X-ray diffraction (XRD) analysis is one of the most effective tools for determining the crystal structure of materials. It is widely used for phase identification, phase composition analysis, residual stress analysis, texture measurement, and grain size determination. In recent years, the grazing incidence X-ray diffraction (GIXRD) technique has been increasingly used to enhance diffraction signals from thin films, making it an important method for thin-film analysis.
This laboratory provides instructional training to help students become familiar with using X-ray diffraction analysis for phase identification and composition analysis. It also supports faculty research and related experimental analyses.
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Major Equipment :
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